Lithography Process Engineer
GlobalFoundries · Singapour
Job description
About the role
As a Lithography Process Engineer you will sustain, optimise and develop photolithography processes in a high‑volume semiconductor fab. You will work with advanced lithography tools and metrology equipment to ensure tight critical dimension (CD) control, overlay accuracy and low defect levels.
Key responsibilities
- Monitor and analyse SPC/ESPC charts using SPACE and respond to OOC/OOS events.
- Perform CD and overlay analysis with CD‑SEM, scatterometry and overlay metrology tools (e.g., KLA, ASML YieldStar).
- Optimise photoresist coating, soft‑bake, exposure, post‑exposure bake and development steps.
- Manage and tune stepper/scanner exposure tools (ASML, Nikon) for optimal performance.
- Design and execute DOE and split‑lot studies using JMP, Klarity ACE and other statistical tools.
- Troubleshoot lithography defects such as bridging, footing, scumming and resist residues.
- Collaborate with Equipment Engineers on tool qualification, focus‑exposure matrix and process‑window optimisation.
- Maintain reticle management, focus/exposure control and alignment strategies.
- Drive improvements in CD uniformity, overlay performance, line‑edge roughness and CDU.
- Support technology transfers, new product introductions and process ramp‑up.
- Lead cross‑functional teams to resolve yield excursions and implement CAPA.
- Ensure compliance with TS16949 and other quality standards.
Required profile
- Bachelor’s degree in Electrical, Electronics, Mechanical, Mechatronics or Microelectronics Engineering.
- 1–3 years of semiconductor wafer process engineering experience.
- Proven problem‑identification and resolution abilities.
- Willingness to work normal, swing or rotating 12‑hour shifts.
Required skills
- SPC/ESPC analysis (SPACE).
- CD‑SEM, scatterometry and overlay metrology (KLA, ASML YieldStar).
- Photoresist process steps (coating, bake, exposure, PEB, development).
- Stepper/scanner tools (ASML, Nikon).
- Design of Experiments and statistical analysis (JMP, Klarity ACE).
- Lithography defect diagnosis.
- Reticle management and alignment strategies.
- TS16949 quality compliance.
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Published 1 month ago
Expires 4 days from now
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GlobalFoundries
Singapour
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