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Lithography Process Engineer

GlobalFoundries · Singapour

Junior 🇬🇧 English
CD-SEM scatterometry reticle management

Job description

About the role

As a Lithography Process Engineer you will sustain, optimise and develop photolithography processes in a high‑volume semiconductor fab. You will work with advanced lithography tools and metrology equipment to ensure tight critical dimension (CD) control, overlay accuracy and low defect levels.

Key responsibilities

  • Monitor and analyse SPC/ESPC charts using SPACE and respond to OOC/OOS events.
  • Perform CD and overlay analysis with CD‑SEM, scatterometry and overlay metrology tools (e.g., KLA, ASML YieldStar).
  • Optimise photoresist coating, soft‑bake, exposure, post‑exposure bake and development steps.
  • Manage and tune stepper/scanner exposure tools (ASML, Nikon) for optimal performance.
  • Design and execute DOE and split‑lot studies using JMP, Klarity ACE and other statistical tools.
  • Troubleshoot lithography defects such as bridging, footing, scumming and resist residues.
  • Collaborate with Equipment Engineers on tool qualification, focus‑exposure matrix and process‑window optimisation.
  • Maintain reticle management, focus/exposure control and alignment strategies.
  • Drive improvements in CD uniformity, overlay performance, line‑edge roughness and CDU.
  • Support technology transfers, new product introductions and process ramp‑up.
  • Lead cross‑functional teams to resolve yield excursions and implement CAPA.
  • Ensure compliance with TS16949 and other quality standards.

Required profile

  • Bachelor’s degree in Electrical, Electronics, Mechanical, Mechatronics or Microelectronics Engineering.
  • 1–3 years of semiconductor wafer process engineering experience.
  • Proven problem‑identification and resolution abilities.
  • Willingness to work normal, swing or rotating 12‑hour shifts.

Required skills

  • SPC/ESPC analysis (SPACE).
  • CD‑SEM, scatterometry and overlay metrology (KLA, ASML YieldStar).
  • Photoresist process steps (coating, bake, exposure, PEB, development).
  • Stepper/scanner tools (ASML, Nikon).
  • Design of Experiments and statistical analysis (JMP, Klarity ACE).
  • Lithography defect diagnosis.
  • Reticle management and alignment strategies.
  • TS16949 quality compliance.

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Published 3 weeks ago

Expires 1 month from now

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GlobalFoundries

Singapour