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Senior Process Engineer – Defectivity

ASM · Singapour

New
Senior 🇬🇧 English
Statistical data analysis Defect inspection Metrology Defect characterization Failure analysis Contamination control Particle reduction Equipment qualification Process qualification Machine learning Advanced analytics

Job description

About the role

As a Senior Process Engineer – Defectivity you will lead defectivity reduction and process improvement initiatives across front‑end wafer processing equipment, leveraging expertise in contamination control, defect characterization and data‑driven problem solving. You will work closely with multidisciplinary teams to develop innovative solutions that improve manufacturing reliability and enable next‑generation semiconductor devices.

Key responsibilities

  • Lead investigations into defectivity issues affecting front‑end wafer processing equipment and manufacturing processes.
  • Identify and resolve equipment‑, process‑, handling‑ and material‑induced defect mechanisms using defect maps, spatial distributions and wafer trends.
  • Apply structured problem‑solving methods such as DOE, statistical analysis, failure analysis and root‑cause investigation.
  • Drive corrective and preventive actions and validate long‑term effectiveness through data‑driven verification.
  • Partner with engineering teams to improve defect performance, process robustness, equipment reliability and manufacturability.
  • Establish defectivity reduction roadmaps and support technology development, qualification and continuous‑improvement initiatives.

Required profile

  • Master's degree or PhD in Materials Science, Physics, Chemical Engineering, Mechanical Engineering, Semiconductor Engineering or a related technical discipline.
  • Minimum 8 years of semiconductor industry experience in process engineering, defectivity engineering, yield engineering or integration engineering.
  • Strong experience supporting front‑end wafer processing equipment and advanced process technologies, with deep understanding of defect generation mechanisms.

Required skills

  • Design of Experiments (DOE) and statistical data analysis.
  • Defect inspection, metrology, characterization and failure analysis techniques.
  • Contamination control and particle reduction methodologies.
  • Root‑cause analysis and data‑driven problem solving.
  • Equipment qualification and process qualification.
  • Machine learning, advanced analytics and AI‑enabled defectivity analysis.

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Published 5 hours ago

Expires 1 month from now

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ASM

Singapour