QEM PQE Electrical Failure Analysis Engineer

About the role

Micron is hiring a QEM PQE Electrical Failure Analysis (EFA) Engineer for its Fab10 facility. You will drive deep technical understanding and resolution of yield, quality and reliability challenges for advanced NAND memory products, supporting both new product introduction (NPI) and high-volume manufacturing (HVM). You will perform die-level electrical analysis, build failure models and run characterization experiments to turn root causes into test, process and design improvements.

Key responsibilities

• Perform electrical failure analysis using bench characterization to identify failure mechanisms at die, circuit and transistor levels
• Construct failure models and root cause understanding for yield excursions, reliability issues and customer returns
• Design and run bench DOE and probe engineering experiments to validate hypotheses and improve yield and quality
• Translate characterization results into test, process or device optimization solutions
• Conduct circuit and layout tracing to correlate electrical failure signatures with physical or process limitations
• Support NPI qualification and HVM issue resolution, working closely with PI, TD, PE, TSE and YE teams
• Develop custom test conditions, scripts and methodologies, and contribute to process capability and cost reduction
• Use AI-assisted tools responsibly to improve efficiency and share AI-enabled improvements

Required profile

• Bachelor's or Master's degree in electronics, microelectronics, material science, physics or applied science
• Excellent problem-solving and analytical skills, and proven ability to communicate clearly in writing and verbally
• Proven ability to manage complex, multi-tasked projects and strong teamwork skills
• Knowledge of circuit analysis, layout tracing, yield analysis and failure mechanisms
• Strong understanding of NAND memory operation, CMOS device physics and wafer fabrication processes
• Hands-on experience in electrical failure analysis, bench characterization, probe testing and DOE methodology
• Baseline digital fluency and role-appropriate AI literacy