Senior Engineer - Electrical Failure Analysis, NTI

About the role

Micron invites an experienced Electrical Failure Analysis Senior Engineer to join its NAND Technology Integration (NTI) team. You will be the go-to expert for diagnosing yield-limiting failures in next-generation NAND products, combining semiconductor expertise with bench testing, probe data analysis and physical failure analysis to accelerate yield learning.

Key responsibilities

• Lead electrical failure analysis: characterization, fault isolation, failure verification and physical de-processing of semiconductor devices.
• Drive root cause analysis of yield-limiting failures by correlating electrical, inline, parametric, probe and fab data.
• Pioneer new FA methodologies and de-processing techniques to improve detection accuracy and turnaround time.
• Apply data analytics to large-scale semiconductor datasets to surface failure signatures, trends and anomalies.
• Deliver clear FA reports and visualizations for technical and executive audiences.
• Partner with Process Integration, Yield Enhancement, Metrology, RDA and Data Science teams to drive yield improvement.
• Support technology transfer of layout and architecture fundamentals from R&D to manufacturing, and present results in global forums.
• Use AI to streamline workflows, optimize processes and enable data-driven decisions.

Required profile

• M.S. or Ph.D. in Electrical Engineering, Microelectronics, Materials Science, Chemical Engineering, Physics or a related field.
• Proven semiconductor industry experience in Failure Analysis, Process Integration, Yield Enhancement or Unit Process.
• In-depth knowledge of nonvolatile memory technologies (NAND/NOR).
• Strong grasp of semiconductor process flow and process-device interactions.
• Excellent analytical, communication and presentation skills, and self-motivation in a fast-paced environment.

Required skills

• SEM, FIB, TEM and elemental analysis (EDS, EELS)
• Data analytics on semiconductor datasets