Senior Engineer, NAND Reliability (STPG PE)

About the role

Micron is hiring a Senior NAND Reliability Product Engineer (STPG PE) to define, evaluate and safeguard the extrinsic and intrinsic reliability of its NAND Flash products. The role works hands-on with large-scale data analysis, electrical failure analysis and cross-functional teams to prevent reliability escapes to customers, combining device physics, circuits, process technology and product engineering.

Key responsibilities

• Define and implement NAND Flash reliability test flows to assess product reliability and prevent extrinsic/intrinsic escapes.
• Perform high-volume statistical data analysis to evaluate NAND DPM and intrinsic reliability risks and trends.
• Drive electrical failure analysis, including advanced characterization, to identify root causes and solution spaces.
• Develop short-term countermeasures such as targeted stresses and screens, applying knowledge of digital/analog circuits, device physics and process engineering.
• Qualify the product with control measures that deliver best-in-class DPM and cell reliability.
• Work with Fab, NAND Technology, NAND Design, Product Development, System Development and Quality/Reliability teams to develop solutions and enable shipment of high-quality products.
• Integrate AI-assisted tools into daily work and share AI-enabled improvements, using baseline digital fluency and role-appropriate AI literacy.
• Support customer inquiries with technical reliability insights and drive strategic initiatives to strengthen the reliability program.

Required profile

• Bachelor's or Master's degree with relevant experience in Electrical Engineering or a related field.
• Knowledge of semiconductor reliability, NAND technology and electrical failure analysis.
• Understanding of design, device physics, circuits and process.
• Strong statistical analysis, communication and problem-solving skills.
• Experience applying AI tools, LLMs and data analysis tools (e.g., Python, JMP, Tableau).
• Team player and self-driven.