Senior Engineer, STPG PE (FDV-Verilog)

About the role

Micron is looking for a Senior Engineer in Product Engineering, NAND Validation/Characterization, specializing in functional and design validation. The role builds scalable, reusable and automated test program frameworks, including AI/ML-driven initiatives, supporting deterministic validation flows and pseudo-random validation (RSG). It covers NAND datasheet commands, features, interfaces and customer-mode operations on silicon platforms, with deep failure analysis and close collaboration with Design, Application Engineering, Product, System and Validation teams.

Key responsibilities

• Design and execute functional and design validation flows for advanced RG NAND devices using simulation platforms.
• Develop deterministic usage-case tests and random sequence generators to validate NAND commands and customer-mode features.
• Perform detailed failure analysis, including root-cause investigations of digital and analog circuitry, and drive issue resolution with cross-functional teams.
• Implement automation frameworks using C-based programming, Python and Perl to improve test development and execution efficiency.
• Apply AI/ML-assisted techniques (data analytics, pattern recognition, anomaly detection) to accelerate failure triage, identify coverage gaps and improve random sequence effectiveness and debug prioritization.
• Use data-driven methods and dashboards to track validation progress, defect trends and release readiness.

Required profile

• At least 3-5 years of relevant professional experience in a similar or related engineering role.
• Bachelor's degree in Electronics Engineering, Computer Engineering or a related discipline.
• Strong interest in design validation, characterization and product engineering.
• Excellent problem-solving and analytical skills, effective written and spoken English, and ability to multitask in a fast-paced environment.

Required skills

• Software development and scripting proficiency (C/C++, Perl, Python).
• Application of AI/ML for test analytics and defect pattern analysis.
• Root cause analysis and automation of test programs.