Senior Member of Technical Staff, NAND Advanced Thin Films Process Development
micron · Fab 10N/X
Job description
About the role
Micron Technology is hiring a Senior Member of Technical Staff for its 3D NAND Advanced Thin Films Process Development team. The role acts as a technical authority, setting strategic direction and leading multi-functional initiatives, driving department-wide impact and influencing technical standards. It involves global projects and mentoring engineers.
Key responsibilities
- Define technical strategy and lead multi-functional projects in structural and electric film development
- Architect solutions and promote innovative technologies across teams
- Influence technical standards and drive process improvements
- Lead advanced process development, fix and integration
- Integrate unit processes into full module packages and validate them, including cross-module interactions and device/process linkages via wafer-level electricals
- Drive root cause analysis, FMEA, SPC and corrective actions that recover yield without trade-offs
- Use characterization tools (SIMS, XPS, TEM, EDX/EELS, electrical stress testing, TDS) to correlate process parameters to device performance and derive reliability and scaling models
- Lead multi-functional teams and vendor engagements, and mentor engineers through training, case studies and hands-on development
- Publish internal papers and BKMs and present to senior leadership
Required profile
- PhD or equivalent in Materials Science, Chemical Engineering, Physics, Chemistry, Electrical Engineering or a related field
- 15 to 20 years of experience in thin film R&D for NAND, specifically plasma and thermal CVD for dielectric (including high-k and low-k) and carbon-based films
- Demonstrated leadership in multi-functional development and vendor collaboration
- Proven track record in solution architecture, process-device correlation and mentoring engineers
Required skills
- Advanced proficiency in thin film processing: Plasma Enhanced CVD, Thermal CVD, ALD
- Optimization of structural and electric film hardware and equipment (dielectric and carbon-based films)
- Understanding of process-mechanical-device interactions, reliability modeling and 3D NAND scaling
- Advanced characterization techniques (SIMS, XPS, TEM, electrical stress testing)
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Published 18 hours ago
Expires 1 month from now
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micron
Fab 10N/X
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