Intern - NAND Wafer Reliability

About the role

Micron is looking for an intern in NAND wafer reliability. The role covers defectivity analysis and failure analysis of NAND flash devices, supporting the qualification of end products such as mobile, consumer and enterprise SSDs. It is based at the Fab 10N/X site.

Key responsibilities

• Analyze NAND defectivity (DPM) Pareto charts to enable qualification of world-class end products (mobile, consumer SSD, enterprise SSD).
• Perform electrical failure analysis (EFA) to solve technical problems using lab tools and techniques.
• Contribute to DPM countermeasures through stress and screen tests, drawing on digital and analog circuit, device physics and process engineering knowledge.
• Carry out physical failure analysis (PFA) and root cause analysis.
• Integrate AI-assisted tools and insights into daily work to improve efficiency, quality or effectiveness, following organizational standards and legal requirements.
• Contribute to continuous improvement by identifying, testing and sharing AI-enabled enhancements within your scope of work.

Required profile

• Master's degree in Electrical Engineering, or a Bachelor's degree in Electrical Engineering.
• Understanding of NAND flash device physics, memory design and fundamental semiconductor processing is an added advantage.
• Effective written and spoken English and good multitasking and prioritization skills.
• Strong problem-solving and analytical skills, self-motivated and enthusiastic.

Required skills

• Knowledge of programming languages such as Python, C or C++.
• NAND flash device physics and memory design.