Senior/Staff Engineer, NTI Metrology

About the role

Micron is looking for a Senior/Staff Engineer in NTI Metrology to own the development, qualification and deployment of advanced metrology applications for 3D NAND process development, with a primary emphasis on Focused Ion Beam (FIB) and one or more of AFM, optical interferometry/WLI, SEM or semiconductor electrical/non-contact characterization methods. The role leads the evaluation of next-generation metrology systems and FOAK technologies and drives technology roadmaps aligned with future NAND requirements.

Key responsibilities

• Develop and implement metrology solutions using FIB, AFM, SEM and related techniques to close inline detection gaps and speed up process learning.
• Evaluate, qualify and deploy next-generation metrology systems and FOAK technologies, assessing measurement capability, accuracy, repeatability, throughput, automation and manufacturing readiness.
• Establish technology roadmaps and build technical partnerships with equipment suppliers and industry collaborators.
• Develop modeling opportunities using metrology, defect detection, AI and ML to understand electrical failure signatures seen at probe and their impact on reliability, yield and performance.
• Work with Process Integration, Yield Enhancement, Process Development Engineering and Manufacturing teams to deliver characterization solutions and enable rapid technology deployment.

Required profile

• Master's or PhD in Materials Science, Mechanical Engineering, Electrical Engineering or Applied Physics.
• At least 7 years of semiconductor metrology development experience, owning the development of new metrology applications, recipes, methodologies or inline monitoring solutions.
• At least 5 years of hands-on FIB experience and one additional advanced metrology technique (AFM, WLI or SEM).
• Proven track record developing metrology applications for process characterization, inline monitoring, root-cause analysis, yield improvement, reliability investigations and technology transfer, including qualification of new metrology technologies and supplier engagement.
• Candidates whose experience is mainly in process engineering, yield engineering, failure analysis or data analysis without direct metrology application development will not be considered.