Associate Engineer - Failure Analysis (TEM Sample Preparation)

About the role

GlobalFoundries, a full-service semiconductor foundry, is hiring an associate engineer for its failure analysis team. The role performs Transmission Electron Microscopy (TEM) sample preparation to support semiconductor failure analysis and characterization, and works night-shift operations.

Key responsibilities

• Conduct pre-FIB sample preparation, including wafer cleaving, optical microscope inspection and defect navigation, sample coating, and sample delayering using RIE or polishing.
• Operate Focused Ion Beam (FIB) systems to mill, thin and prepare lamellae for TEM analysis.
• Ensure samples meet quality, cleanliness and thickness requirements for high-quality TEM imaging.
• Support urgent and critical requests from fabrication and failure analysis teams.
• Communicate with engineers, peers and shift counterparts to ensure smooth handover between shifts.
• Follow laboratory safety procedures, SOPs and quality standards.
• Take part in continuous improvement of TEM sample preparation and night-shift efficiency.

Required profile

• Diploma in courses relevant to electrical/electronics/mechatronics engineering and microelectronics engineering.
• Ability to work a 12-hour night shift independently; a disciplined, committed person.
• Strong problem-solving skills and the ability to troubleshoot sample preparation issues under time pressure.

Required skills

• Knowledge of TEM sample preparation using a focused ion beam microscope is preferred.