Senior Associate Engineer - Failure Analysis (Night Shift)

About the role

GlobalFoundries, a leading manufacturer of essential semiconductors, is looking for a Senior Associate Engineer in failure analysis. The role involves preparing and analysing samples using TEM and FIB techniques to support semiconductor failure analysis and characterization, and requires working the 12-hour night-shift pattern.

Key responsibilities

• Perform TEM analysis and TEM sample preparation using Focused Ion Beam (FIB) microscopy, including pre-FIB steps such as wafer cleaving, optical microscope inspection, sample coating and delayering with RIE or polishing.
• Operate FIB systems to mill, thin and prepare lamellae for TEM analysis.
• Conduct TEM profiling and measurements by bright-field and scanning mode imaging, and perform EDX elemental analysis.
• Ensure samples meet quality, cleanliness and thickness requirements for high-quality TEM imaging.
• Support urgent and critical requests from fabrication and failure analysis teams.
• Communicate with engineers, peers and shift counterparts for smooth handover between shifts.
• Follow laboratory safety procedures, SOPs and quality standards, and take part in continuous improvement of TEM sample preparation and night-shift efficiency.

Required profile

• Diploma in Engineering (Electrical, Electronics, Mechatronics or Microelectronics Engineering).
• Ability to work the 12-hour night-shift pattern independently.
• Strong problem-solving skills and fast learning, with good hands-on capability.
• Basic knowledge of the semiconductor field.
• Good interpersonal and communication skills, teamwork, independence and self-discipline.

Required skills

• Preferred: hands-on experience with FIB for TEM sample preparation.
• Preferred: hands-on experience and knowledge of TEM and FIB.