Senior Member of Technical Staff - CMP Process Development, NAND
micron · Fab 10N/X
Job description
About the role
Micron is hiring a Senior Member of Technical Staff (SMTS) for its Next Generation NAND research and development CMP team. This is a module-level CMP technical authority who defines CMP technical direction, leads first-of-a-kind (FOAK) developments and drives cross-functional execution across NAND nodes. The role works closely with process integration and areas such as wet etch, CVD, diffusion, metals, lithography and dry etch.
Key responsibilities
- Own and lead key NAND CMP process modules, turning technology challenges into executable roadmaps across current and future nodes
- Drive cross-functional execution across Technology Development, Process Integration, Manufacturing and Equipment teams
- Lead FOAK CMP process development, including recipe architecture, control strategies and integration alignment
- Ensure process robustness and manufacturability through run-to-run controls, SPC, qualification execution and risk mitigation
- Solve complex yield, defectivity and integration issues using model-based and data-driven approaches
- Define and execute process-level hardware strategies with equipment suppliers
- Mentor engineers, build subject matter expert pipelines, publish internal papers and present to senior leadership
- Integrate AI-assisted tools into daily work and share AI-enabled improvements
Required profile
- PhD with at least 12 years, or Master's degree with at least 15 years, of relevant experience in Electrical Engineering, Materials Science, Chemical Engineering, Physics or a related field
- Experience in CMP process development and deep expertise in CMP chemistry, physics and integration
- Publications, patents and a strong record of technical contributions
- Demonstrated technical leadership in problem solving and ability to influence without authority across process integration, equipment and manufacturing teams
Required skills
- In-depth knowledge of CMP fundamentals, including pad-sluurry-wafer interactions, slurry chemistry and pattern density effects
- Understanding of multiple CMP process types (metal, dielectric, barrier/hardmask, poly-Si/Si)
- Hands-on experience with advanced 300 mm CMP platforms
- Statistical process control (SPC), data analysis and qualification methodologies
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Published 1 day ago
Expires 1 month from now
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micron
Fab 10N/X
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