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Engineer, Metrology & Real‑Time Defects Analysis

Micron Technology · Singapour

🇬🇧 English
Statistical Process Control (SPC) advanced analytics techniques

Job description

About the role

We are seeking an Engineer specialized in Metrology and Real‑Time Defects Analysis to join Micron’s semiconductor manufacturing team. The role focuses on developing measurement recipes, applying analytics, and driving defectivity improvements to enhance product yield and quality.

Key responsibilities

  • Develop and maintain measurement recipes that deliver rapid, accurate feedback on product integrity.
  • Apply advanced analytics to detect and address deviations in equipment and processes.
  • Design experiments to uncover defect sources and formation mechanisms.
  • Collaborate with cross‑functional engineers to implement breakthrough solutions for defect reduction.
  • Utilize innovative inspection tools for defect detection and contribute to tool qualification.
  • Set up and monitor Statistical Process Control (SPC) charts, define control limits, and apply effective sampling strategies.
  • Partner with Engineering Operations and Application teams to optimise tool maintenance and utilisation.
  • Lead projects aimed at improving inline detection, reducing cost, and increasing machine availability.
  • Work with tool suppliers to explore novel approaches for advancing shrinking technology nodes.
  • Provide data‑driven analysis and recommendations to support process changes, equipment availability, and cost‑reduction initiatives.
  • Train engineering teams on recipe maintenance, tool recovery, troubleshooting, and maintenance activities.

Required profile

  • Proactive problem‑solver with a focus on yield and quality impact.
  • Experience designing experiments and analysing defect data.
  • Strong collaboration skills across multiple engineering disciplines.
  • Ability to communicate analytical results and actionable recommendations.

Required skills

  • Statistical Process Control (SPC) implementation and monitoring.
  • Advanced analytics techniques for process deviation detection.
  • AI‑assisted analysis tools for defect detection.

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Published 2 months ago

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Micron Technology

Singapour